BAO RESEARCH

Baoresearch Cover

[BAO RESEARCH] CHAPTER 11 | CASE STUDY: FILM THICKNESS ERROR ANALYSIS

This article will analyze the control and application of system errors through two cases. The first case is fabrication of broadband AR coatings based on Kaufman source, and the second case is the fundamental frequency AR coatings commonly used in laser systems. In each case, the film thickness error will be analyzed step by step based on the example spectrum, and the design method to improve the sensitivity of the film system will be exemplified based on the systematic error obtained by the analysis.

[BAO RESEARCH] CHAPTER 11 | CASE STUDY: FILM THICKNESS ERROR ANALYSIS Read More »

Baoresearch Cover

[BAO RESEARCH] DESIGN AND FABRICATION OF 5 MICRON LONG-PASS FILTER

The 5um long pass filter is one of the core components of the infrared temperature sensor. This article will describe the design and fabrication of this infrared filter, providing an integrated solution from selection of substrate materials, film materials, to film system design, coating process and equipment configuration.

[BAO RESEARCH] DESIGN AND FABRICATION OF 5 MICRON LONG-PASS FILTER Read More »

Baoresearch Cover

[BAO RESEARCH] CHAPTER 10 | ESTIMATING THE SPECTRAL CHARACTERISTICS OF AR COATINGS

In the previous chapter, common errors of coatings were explained. Mastering the errors can be used to estimate the effect that thin film design can achieve in actual production. Anti-reflection film is an important part of any optical device, which accounts for more than 50% of the optical film market. This chapter mainly describes how to estimate the spectral characteristics of the AR coating that can be achieved by the film material combination.

[BAO RESEARCH] CHAPTER 10 | ESTIMATING THE SPECTRAL CHARACTERISTICS OF AR COATINGS Read More »

Baoresearch Cover

[BAO RESEARCH] CHAPTER 9 | FILM THICKNESS ERROR ANALYSIS

With the same spectral requirements, we can often get multiple design solutions, but how to choose the most suitable solution? Pratically, the actual prepared spectrum often deviates from the design. Therefore, it is very important to evaluate the manufacturability of the designed spectrum, by analyzing the thickness error based on the equipment and process.

[BAO RESEARCH] CHAPTER 9 | FILM THICKNESS ERROR ANALYSIS Read More »

Baoresearch Cover

[BAO RESEARCH] CHAPTER 4 | MEASUREMENT AND ERROR OF SPECTROPHOTOMETER (1)

As mentioned in the previous chapter, no matter what method is used to calculate the optical constants of the thin film or simulate the inversion spectrum, the most fundamental material that affects the solution of the error is the accuracy of the spectral data. To understand the principle and source of measurement error of different

[BAO RESEARCH] CHAPTER 4 | MEASUREMENT AND ERROR OF SPECTROPHOTOMETER (1) Read More »